Moinuddin Ahmed
Principal Research Scientist
Lead, Electronic Materials Characterization Group
Biography
Moinuddin Ahmed is a member of the Emergent Materials and Processes group of Argonne National Laboratory. Dr. Ahmed is currently working as a technical lead to establishing power electronics reliability testing facility for Wide- and Ultrawide-Bandgap materials including SiC and GaN-based power devices. His research interests also include performing in-situ physics-of-failure analysis of electronic devices and components in harsh conditions, machine learning based degradation model of power electronic device, material and component, and hardware cybersecurity. He has been working in the research and development area for more than ten years.
Education
Ph.D. in Electrical Engineering, University of Texas at Arlington, Texas (2014).
B.Sc. in Electrical and Electronic Engineering, Bangladesh Univ. of Eng. & Tech., Dhaka, Bangladesh (2009).
Awards
Argonne Postdoctoral Performance Award, 2020
Transducer Research Foundation Travel Award, 2012.
CONTACT (Consortium for Nanomaterials for Aerospace Commerce and Technology) Award, 2012.
Dean Doctoral Fellowship, Electrical Engineering, University of Texas at Arlington, 2009-2014.
Dean Scholarship, Bangladesh University of Engineering and Technology (BUET), 2008.
BUET Technical Scholarship, 2004-2008.
Honors and Memberships
Member, IEEE.
Member, Tau Beta Pi.
Member, Eta Kappa Nu.
Member, American Vacuum Society.
